Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

Galatro, Luca; Spirito, M

Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

Conference paper (2015)

Authors

Luca Galatro Electronics

M Spirito Electronics

Research Group

Electronics

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Published Date

2015

Language

English

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Research Group

Electronics

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