Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

Conference paper (2015)

Authors

Luca Galatro Electronics - EEMCS
M Spirito Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2015

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics