Linear-defect induced thermal instability in YBCO thin films in microwave fields

Pan, V.M.; Tretiatchenko, C.G.; Flis, VS; Komashko, VA; Kalenyuk, OA; Pashitskij, EA; Ivanyuta, AN; Melkov, GA; Zandbergen, H.W.

Linear-defect induced thermal instability in YBCO thin films in microwave fields

Journal article (2003)

Authors

V.M. Pan External organisation

C.G. Tretiatchenko External organisation

VS Flis External organisation

VA Komashko External organisation

OA Kalenyuk External organisation

EA Pashitskij External organisation

AN Ivanyuta External organisation

GA Melkov External organisation

H.W. Zandbergen

To reference this document use:

http://resolver.tudelft.nl/uuid:e87c967b-bfd4-4423-9ab8-4d30eb46f6e3

More Info

expand_more

Published Date

2003

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.