Technological challenges in defect detection for metal strip; pattern recognition algorithms

Conference paper (1999)

Authors

P.P. Jonker ImPhys/Quantitative Imaging
R.P.W. Duin ImPhys/Quantitative Imaging
D. de Ridder ImPhys/Quantitative Imaging
R. Ligteringen ImPhys/Quantitative Imaging
D.M.J. Tax ImPhys/Quantitative Imaging
Research Group
ImPhys/Quantitative Imaging
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Published Date

1999

Language

Undefined/Unknown

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Research Group

ImPhys/Quantitative Imaging