In-situ TEM studies of the electromigration process in a single InAs nanowire

Conference paper (2014)

Authors

M. Neklyudova QN/High Resolution Electron Microscopy
H.W. Zandbergen QN/High Resolution Electron Microscopy
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2014

Language

English

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Research Group

QN/High Resolution Electron Microscopy