25th Anniversary of STED Microscopy and the 20th Anniversary of SIM

Feature introduction

Journal article (2020)

Authors

Peter Kner University of Georgia
Suliana Manley Swiss Federal Institute of Technology
Yoav Shechtman Technion Israel Institute of Technology
S. Stallinga ImPhys/Imaging Physics
Department
ImPhys/Imaging Physics
Copyright: © 2020 Peter Kner, Suliana Manley, Yoav Shechtman, S. Stallinga
DOI: https://doi.org/10.1364/BOE.391490
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Published Date

2020

Language

English

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Department

ImPhys/Imaging Physics

Abstract

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.

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