Uncertainty quantification for monotone stochastic degradation models

Journal article (2018)

Authors

P. Chen Institute of High Performance Computing
Zhisheng Ye National University of Singapore
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Published Date

2018

Language

English

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Abstract

Degradation data are an important source of product reliability information. Two popular stochastic models for degradation data are the Gamma process and the inverse Gaussian (IG) process, both of which possess monotone degradation paths. Although these two models have been used in numerous applications, the existing interval estimation methods are either inaccurate given a moderate sample size of the degradation data or require a significant computation time when the size of the degradation data is large. To bridge this gap, this article develops a general framework of interval estimation for the Gamma and IG processes based on the method of generalized pivotal quantities. Extensive simulations are conducted to compare the proposed methods with existing methods under moderate and large sample sizes. Degradation data from capacitors are used to illustrate the proposed methods.