Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Journal article (2017)

Authors

Rik V. Mom Universiteit Leiden

Willem G. Onderwaater Universiteit Leiden, European Synchrotron Radiation Facility

Bert Crama Universiteit Leiden

Peter van der Tuijn Leiden Probe Microscopy B.V., Universiteit Leiden

Roberto Felici European Synchrotron Radiation Facility

Wilhelmus M.M. Kessels Eindhoven University of Technology

Francesco Carlà European Synchrotron Radiation Facility

J.G.E.M. Frenken Universiteit Leiden, Advanced Research Center for Nanolithography

I.A. Groot Universiteit Leiden

M. J. Rost Universiteit Leiden

Maciej Jankowski European Synchrotron Radiation Facility

Sabine Wenzel Universiteit Leiden

Leon Jacobse Universiteit Leiden

P.F.A. Alkemade QN/Kavli Nanolab Delft - , Kavli institute of nanoscience Delft

Vincent Vandalon Eindhoven University of Technology

Matthijs A. van Spronsen Universiteit Leiden

Matthijs van Weeren Universiteit Leiden

Research Group

QN/Kavli Nanolab Delft () (TU Delft)

Synchrotron radiation High-pressure surface science Operando catalysis research Scanning tunneling microscopy

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http://resolver.tudelft.nl/uuid:c69a11b3-e4c1-4955-83d8-2c4a3965b79b

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Published Date

01-11-2017

Language

English

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Faculty

Applied Sciences

Department

QN/Quantum Nanoscience

Research Group

QN/Kavli Nanolab Delft

Abstract

A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.

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