Re-scan confocal microscopy (RCM) improves the resolution of confocal microscopy and increases the sensitivity

De Luca, Giulia; Breedijk, Ronald; Hoebe, Ron; Stallinga, S.; Manders, Erik

Re-scan confocal microscopy (RCM) improves the resolution of confocal microscopy and increases the sensitivity

Journal article (2017)

Authors

Giulia De Luca Universiteit van Amsterdam

Ronald Breedijk Universiteit van Amsterdam

Ron Hoebe Universiteit van Amsterdam

S. Stallinga ImPhys/Quantitative Imaging

Erik Manders Universiteit van Amsterdam

Research Group

ImPhys/Quantitative Imaging

Scanning microscopy Confocal microscopy Super-resolution microscopy High sensitive microscopy Three-dimensional microscopy

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Published Date

2017-3

Language

English

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Research Group

ImPhys/Quantitative Imaging

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