Extracting the component values of single electron tunneling transistors from measurement results

Conference paper (2000)

Authors

RH Klunder Electronics - EEMCS
J. Hoekstra Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
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Published Date

2000

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics