Total Ionizing Dose (TID) Impact on Basic Amplifier Stages

Journal article (2022)

Authors

Sadik İlik Istanbul Technical University

Mustafa Berke Yelten Istanbul Technical University

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Degradation Ionizing radiation Radiation effects Amplifier Radio frequency Transistors Threshold voltage TID Integrated circuit modeling Analog circuits Cascode Common gate Common source Leakage currents Total ionizing dose

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Published Date

2022

Language

English

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Abstract

This paper discusses the impact of total ionizing dose (TID) on basic amplifier stages that are biased right above the device threshold voltages. Existing TID degradation-aware transistor models have been leveraged in circuit simulations. The simulation methodology is developed to account for operating currents comparable to TID-induced leakage currents. It is shown that depending on the TID level, a DC input voltage level can be found for which performance characteristics such as the voltage gain can be retained to be similar in pre-and post-irradiation conditions.