Dual-source vacuum deposition of pure and mixed halide 2D perovskites

Thin film characterization and processing guidelines

Journal article (2020)

Authors

Maria Grazia La-Placa Universitat Politécnica de Valencia
Dengyang Guo ChemE/Opto-electronic Materials - AS
Lidón Gil-Escrig Helmholtz-Zentrum Berlin
Francisco Palazon Universitat Politécnica de Valencia
Michele Sessolo Universitat Politécnica de Valencia
Henk J. Bolink Universitat Politécnica de Valencia
Research Group
ChemE/Opto-electronic Materials (AS) (TU Delft)
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Published Date

2020

Language

English

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Faculty

Applied Sciences

Department

ChemE/Chemical Engineering

Research Group

ChemE/Opto-electronic Materials

Abstract

The dual-source vacuum deposition of 2D perovskite films of the type PEA2PbX4, (PEA = phenethylammonium and X = I-, Br-, or a combination of both) is presented. Low-temperature deposited 2D perovskite films showed high crystallinity with the expected trend of bandgap as a function of halide type and concentration. Importantly, we observed an unavoidable halide cross-contamination among different deposition runs, as well as a strong dependence of the material quality on the type of halide precursors used. These findings should be taken into account in the development of vacuum processing for low-dimensional mixed halide perovskites.

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