Fast statistical analysis of RC nets subject to manufacturing variabilities

Conference paper (2011)

Authors

Y. Bi Signal Processing Systems - EEMCS
K.J. van der Kolk Signal Processing Systems - EEMCS
JF Villena External organisation
LM Silveira External organisation
N.P. van der Meijs Signal Processing Systems - EEMCS
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
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Published Date

2011

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems