Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Mitterbauer, C; Hebert, C; Kothleitner, G; Hofer, F; Schattschneider, P; Zandbergen, H.W.

Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Journal article (2004)

Authors

C Mitterbauer External organisation

C Hebert External organisation

G Kothleitner External organisation

F Hofer External organisation

P Schattschneider External organisation

H.W. Zandbergen

To reference this document use:

http://resolver.tudelft.nl/uuid:af838f09-44b0-4cb6-b032-d187eded70f5

More Info

expand_more

Published Date

2004

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.