Mechanical-stress effect in the base-emitter voltage of integrated bipolar transistors

Conference paper (2002)

Authors

F Fruett Electronics - EEMCS
GCM Meijer Electronic Instrumentation - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
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Published Date

2002

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics