Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

Journal article (2010)

Authors

A. V. Vasilieva Petersburg Nuclear Physics Institute (PNPI)

N. A. Grigoryeva St. Petersburg State University

AA Mistonov St. Petersburg State University

N. A. Sapoletova Chemistry Faculty of M. V. Lomonosov Moscow State University

K. S. Napolskii Chemistry Faculty of M. V. Lomonosov Moscow State University

A. A. Eliseev Chemistry Faculty of M. V. Lomonosov Moscow State University

A. V. Lukashin Chemistry Faculty of M. V. Lomonosov Moscow State University

Yu D. Tretyakov Chemistry Faculty of M. V. Lomonosov Moscow State University

W.G. Bouwman RST/Neutron and Positron Methods in Materials -

More Authors... External organisation

Research Group

RST/Neutron and Positron Methods in Materials () (TU Delft)

DOI: https://doi.org/10.1088/1742-6596/247/1/012029

To reference this document use:

http://resolver.tudelft.nl/uuid:ab6816a0-8eca-478a-a582-e4db3c1e1480

More Info

expand_more

Published Date

2010

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Research Group

RST/Neutron and Positron Methods in Materials

Abstract

Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a₀ 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length L_tran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L _long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.

Files

A_V_Vasilieva_2010_J._Phys._Co... (pdf)

(pdf | 1.27 Mb)

Unknown license