Measuring onion cultivars with image analysis using inflection points

Journal article (1996)

Authors

GWAM van der Heijden External organisation
A.M. Vossepoel ImPhys/Quantitative Imaging
G Polder ImPhys/Quantitative Imaging
Research Group
ImPhys/Quantitative Imaging
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Published Date

1996

Language

Undefined/Unknown

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Research Group

ImPhys/Quantitative Imaging