Calibration and characterization techniques for on-wafer device characterization

Conference paper (2015)

Authors

L. Galatro Electronics - EEMCS
M. Spirito Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
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Published Date

2015

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics