Base resistance distribution in bipolar transistors, relevance to compact noise modeling and extraction from admittance parameters

Conference paper (2010)

Authors

F. Vitale Electronic Components, Technology and Materials - EEMCS
R Pijper External organisation
R. van der Toorn Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2010

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials