Nanoscale contact line visualization based on total internal reflection fluorescence microscopy

Franken, M.J.Z.; Poelma, C.; Westerweel, J.

Nanoscale contact line visualization based on total internal reflection fluorescence microscopy

Journal article (2013)

Authors

M.J.Z. Franken Fluid Mechanics - Mechanical, Maritime and Materials Engineering

C. Poelma Fluid Mechanics - Mechanical, Maritime and Materials Engineering

J. Westerweel Fluid Mechanics - Mechanical, Maritime and Materials Engineering

Research Group

Fluid Mechanics (Mechanical, Maritime and Materials Engineering) (TU Delft)

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http://resolver.tudelft.nl/uuid:98824dae-c98b-47ba-bc61-bb7606db34e6

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Published Date

2013

Language

English

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Process and Energy

Research Group

Fluid Mechanics