Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions

Conference paper (2011)

Authors

V. Popovich Joining and Mechanical Behavior
J.M. Westra Photovoltaic Materials and Devices - EEMCS
R.A.C.M.M. van Swaaij Photovoltaic Materials and Devices - EEMCS
M. Janssen Joining and Mechanical Behavior
IJ Bennett External organisation
I.M. Richardson Joining and Mechanical Behavior
Research Group
Joining and Mechanical Behavior
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Published Date

2011

Language

English

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Research Group

Joining and Mechanical Behavior