Impact of spot defects on fault modeling and tests in dual-port memories

Conference paper (2001)

Authors

S. Hamdioui Computer Engineering - EEMCS
AJ van de Goor External organisation
D Eastwick External organisation
M Rodgers External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2001

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering