Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC

Klaver, A; Warman, J.M.; de Haas, M.P.; Metselaar, JW; van Swaaij, R.A.C.M.M.

Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC

Conference paper (2004)

Authors

A Klaver Electronic Components, Technology and Materials -

J.M. Warman Old - Section Radiation Chemistry

M.P. de Haas Old - Section Radiation Chemistry

JW Metselaar Electronic Components, Technology and Materials -

R.A.C.M.M. van Swaaij Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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Published Date

2004

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials