Yield predictions in process equipment: an FDF/LES approach

Journal article (2004)

Authors

E van Vliet Old - sect Kramers Laboratory (MSP/FT)
Research Group
Old - sect Kramers Laboratory (MSP/FT)
More Info
expand_more

Published Date

2004

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - sect Kramers Laboratory (MSP/FT)