Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

Jansen, J; Otten, MT; Zandbergen, Henny W.

Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

Journal article (2013)

Authors

J Jansen QN/High Resolution Electron Microscopy

MT Otten External organisation

Henny W. Zandbergen QN/High Resolution Electron Microscopy

Research Group

QN/High Resolution Electron Microscopy

To reference this document use:

http://resolver.tudelft.nl/uuid:8ee2f469-08d6-47fa-a378-13cc02c68e89

More Info

expand_more

Published Date

2013

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

QN/High Resolution Electron Microscopy

Abstract

A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.

No files available

Metadata only record. There are no files for this journal article.