Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers

Iossad, N; Kroug, M; Zijlstra, T; Ermakov, AB; Jackson, BD; Zuiddam, M.R.; Meijer, FE; Klapwijk, TM

Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers

Journal article (2003)

Authors

N Iossad QN/Fysics of NanoElectronics

M Kroug QN/Fysics of NanoElectronics

T Zijlstra QN/Fysics of NanoElectronics

AB Ermakov External organisation

BD Jackson QN/Fysics of NanoElectronics

M.R. Zuiddam QN/Kavli Nanolab Delft

FE Meijer QN/Fysics of NanoElectronics

TM Klapwijk QN/Fysics of NanoElectronics

Research Group

QN/Fysics of NanoElectronics

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Published Date

2003

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Research Group

QN/Fysics of NanoElectronics

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