An Empirical Study on the Usage of Testability Information to Fault Localization in Software

Gonzalez Sanchez, A.; Abreu, RF; Gross, H.G.; van Gemund, A.J.C.

An Empirical Study on the Usage of Testability Information to Fault Localization in Software

Conference paper (2011)

Authors

A. Gonzalez Sanchez Software Engineering

RF Abreu Software Engineering

H.G. Gross Software Engineering

A.J.C. van Gemund Embedded Systems, Data-Intensive Systems

Research Group

Software Engineering

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Published Date

2011

Language

English

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Research Group

Software Engineering

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