Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

Setekera, R.; Tiemeijer, LF; van der Toorn, R.

Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

Journal article (2014)

Authors

R. Setekera Electronic Components, Technology and Materials

LF Tiemeijer External organisation

R. van der Toorn Mathematical Physics, Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2014

Language

English

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Research Group

Electronic Components, Technology and Materials

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