Hot-carrier degradation analysis based on ring oscillators

Journal article (2006)

Authors

JC Wang External organisation
E Olthof External organisation
JW Metselaar Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials