Interface roughness fractality effects on the electron mobility in semiconducting quantum wells

Palasantzas, G; Barnas, J; Geerligs, LJ

Interface roughness fractality effects on the electron mobility in semiconducting quantum wells

Journal article (1998)

Authors

G Palasantzas Old organisation TN/TechnischeNatuurkunde voorm

J Barnas External organisation

LJ Geerligs QN/Fysics of NanoElectronics

Department

Old organisation TN/TechnischeNatuurkunde voorm

To reference this document use:

http://resolver.tudelft.nl/uuid:76df467b-1288-40ca-8cfb-ceeb8e0c9be4

More Info

expand_more

Published Date

1998

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Department

Old organisation TN/TechnischeNatuurkunde voorm