Thickness evaluation of deposited pureb layers in micro-/millimeter-sized windows to Si

Conference paper (2014)

Authors

V. Mohammadi Electronic Components, Technology and Materials - EEMCS
S Ramesh External organisation
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials