Base-band impedance control and calibration for on-wafer linearity measurements

Pelk, M.J.; de Vreede, Leo; Spirito, M.; Jos, HFF

Base-band impedance control and calibration for on-wafer linearity measurements

Conference paper (2004)

Authors

M.J. Pelk Old - EWI Ch. Integrated Sensing Devices

Leo de Vreede Old - EWI Ch. Integrated Sensing Devices

M. Spirito Old - EWI Ch. Integrated Sensing Devices

HFF Jos External organisation

Research Group

Old - EWI Ch. Integrated Sensing Devices

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Published Date

2004

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Research Group

Old - EWI Ch. Integrated Sensing Devices

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