Comparison of static and dynamic faults in 65nm memory technology

Conference paper (2006)

Authors

S. Hamdioui Computer Engineering - EEMCS
Z. Al-Ars Computer Engineering - EEMCS
G. Gaydadjiev Computer Engineering - EEMCS
J. Delos Reyes External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering