On maximizing the compound yield for 3D wafer-to-wafer stacked ICs

Conference paper (2010)

Authors

Mottaqiallah Taouil Computer Engineering - EEMCS
S Hamdioui Computer Engineering - EEMCS
J Verbree External organisation
E Marinissen External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2010

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering