Characterization of the fabrication process of Nb/Al-AlNx/Nb tunnel junctions with low RnA values up to 1 omega mu m²

Journal article (2002)

Authors

N Iossad QN/Fysics of NanoElectronics
AB Ermakov External organisation
FE Meijer QN/Fysics of NanoElectronics
BD Jackson QN/Fysics of NanoElectronics
T.M. Klapwijk QN/Fysics of NanoElectronics
Research Group
QN/Fysics of NanoElectronics
More Info
expand_more

Published Date

2002

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

QN/Fysics of NanoElectronics