Extended-source interferometry for at-wavelength testing of EUV optics.

Conference paper (1999)

Authors

M. Visser External organisation
M. Dekker External organisation
PE Hegeman External organisation
J.J.M. Braat ImPhys/Optics - AS
Research Group
ImPhys/Optics (AS) (TU Delft)
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Published Date

1999

Language

Undefined/Unknown

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics