Efficient sensitivity based capacitance modeling for systematic and random geometric variations

Bi, Y.; Harpe, P; van der Meijs, N.P.

Efficient sensitivity based capacitance modeling for systematic and random geometric variations

Conference paper (2011)

Authors

Y. Bi Signal Processing Systems

P Harpe External organisation

N.P. van der Meijs Signal Processing Systems

Research Group

Signal Processing Systems

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Published Date

2011

Language

English

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Research Group

Signal Processing Systems

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