A CMOS image sensor with row and column profiling means

Conference paper (2008)

Authors

N. Xie Electronic Instrumentation - EEMCS
A.J.P.A.M. Theuwissen Electronic Instrumentation - EEMCS
X Wang Electronic Instrumentation - EEMCS
Johan Leijtens External organisation
H Hakkesteegt External organisation
H Jansen External organisation
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation