Experimental characterization of roughness induced scattering losses in PECVD SiC waveguides

Pandraud, G.; Margallo-Balbás, E; Yang, C.; French, Paddy

Experimental characterization of roughness induced scattering losses in PECVD SiC waveguides

Journal article (2011)

Authors

G. Pandraud Electronic Components, Technology and Materials

E Margallo-Balbás External organisation

C. Yang Electronic Instrumentation

Paddy French Electronic Instrumentation

Research Group

Electronic Components, Technology and Materials

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Published Date

2011

Language

English

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Research Group

Electronic Components, Technology and Materials

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