Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

Hou, R.; Spirito, M.; Heeres, R; van Rijs, F.; Vreede, Leo C. N. de

Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

Conference paper (2015)

Authors

R. Hou Electronics

M. Spirito Electronics

R Heeres External organisation

F. van Rijs External organisation

Leo C. N. de Vreede Old - EWI Ch. Integrated Sensing Devices, Electronics

Research Group

Electronics

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Published Date

2015

Language

English

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Research Group

Electronics

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