Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

Conference paper (2015)

Authors

R. Hou Electronics - EEMCS
M. Spirito Electronics - EEMCS
R Heeres External organisation
F van Rijs External organisation
L.C.N. de Vreede Old - EWI Ch. Integrated Sensing Devices , Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2015

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics