A study on the robustness of Pseudo Random Binary Array based surface characterization

Conference paper (1998)

Authors

HJW Spoelder External organisation
F. Vos ImPhys/Quantitative Imaging
EM Petriu External organisation
FCA Groen External organisation
Research Group
ImPhys/Quantitative Imaging
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Published Date

1998

Language

Undefined/Unknown

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Research Group

ImPhys/Quantitative Imaging

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