Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

van Aert, S; Den Dekker, A.J.; van den Bos, A; Van Dyck, D; Chen, JH

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

Journal article (2005)

Authors

S van Aert DISC

A.J. Den Dekker DISC

A van den Bos

D Van Dyck External organisation

JH Chen QN/High Resolution Electron Microscopy

Research Group

DISC

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2005

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Research Group

DISC

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