Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors

de Boer, RWI; Iossad, N; Stassen, AF; Klapwijk, Teun; Morpurgo, AF

Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors

Journal article (2005)

Authors

RWI de Boer QN/Mol. Electronics & Devices

N Iossad QN/Mol. Electronics & Devices

AF Stassen QN/Mol. Electronics & Devices

Teun Klapwijk QN/Fysics of NanoElectronics

AF Morpurgo QN/Mol. Electronics & Devices

Research Group

QN/Mol. Electronics & Devices

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Published Date

2005

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Research Group

QN/Mol. Electronics & Devices

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