Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOS

Journal article (2012)

Authors

Amir Zjajo Signal Processing Systems - EEMCS
M.J. Barragan External organisation
J Pineda de Gyvez External organisation
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
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Published Date

2012

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems