The negative effect of high-temperature annealing on charge-carrier lifetimes in microcrystalline PCBM

Warman, JM; de Haas, Thijs; Anthopoulos, ThD; de Leeuw, DM

The negative effect of high-temperature annealing on charge-carrier lifetimes in microcrystalline PCBM

Journal article (2006)

Authors

JM Warman ChemE/Opto-electronic Materials

Thijs de Haas ChemE/Opto-electronic Materials

ThD Anthopoulos External organisation

DM de Leeuw External organisation

Research Group

ChemE/Opto-electronic Materials

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Published Date

2006

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Research Group

ChemE/Opto-electronic Materials

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