The negative effect of high-temperature annealing on charge-carrier lifetimes in microcrystalline PCBM

Journal article (2006)

Authors

J.M. Warman ChemE/Opto-electronic Materials - AS
M.P. de Haas ChemE/Opto-electronic Materials - AS
ThD Anthopoulos External organisation
DM de Leeuw External organisation
Research Group
ChemE/Opto-electronic Materials (AS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

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Faculty

Applied Sciences

Department

ChemE/Chemical Engineering

Research Group

ChemE/Opto-electronic Materials