High-resolution electron microscopy and electron tomography: resolution versus precision

van Aert, S; Den Dekker, Arnold J.; Van Dyck, D; van den Bos, A

High-resolution electron microscopy and electron tomography: resolution versus precision

Journal article (2002)

Authors

S van Aert Old - sect Systems, Signals and control Group (IST/MMR)

Arnold J. Den Dekker Old - sect Systems, Signals and control Group (IST/MMR)

D Van Dyck External organisation

A van den Bos Old - sect Systems, Signals and control Group (IST/MMR)

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

To reference this document use:

http://resolver.tudelft.nl/uuid:3d90bad5-14ec-429e-802d-47db702375bb

More Info

expand_more

Published Date

2002

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

No files available

Metadata only record. There are no files for this journal article.