Combined SANS-SESANS, from 1 nm to 0.1 mm in one instrument

Journal article (2011)

Authors

W. G. Bouwman RST/Neutron and Positron Methods in Materials
Chris Duif RST/Neutron and Positron Methods in Materials
J. Plomp RST/Neutron and Positron Methods in Materials
A Wiedenmann External organisation
R Gahler External organisation
Research Group
RST/Neutron and Positron Methods in Materials
More Info
expand_more

Published Date

2011

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

RST/Neutron and Positron Methods in Materials

No files available

Metadata only record. There are no files for this journal article.