Ultra low background cryogenic test facility for far-infrared radiation detectors

Journal article (2012)

Authors

J.J.A. baselsmans External organisation
S.J.C. Yates External organisation
P Diener External organisation
P.J. de Visser QN/Fysics of NanoElectronics
Research Group
QN/Fysics of NanoElectronics
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Published Date

2012

Language

English

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Research Group

QN/Fysics of NanoElectronics