Ultra low background cryogenic test facility for far-infrared radiation detectors

baselsmans, J.J.A.; Yates, Stephen J.C.; Diener, P; Visser, P. J.

Ultra low background cryogenic test facility for far-infrared radiation detectors

Journal article (2012)

Authors

J.J.A. baselsmans External organisation

Stephen J.C. Yates External organisation

P Diener External organisation

P. J. Visser QN/Fysics of NanoElectronics

Research Group

QN/Fysics of NanoElectronics

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Published Date

2012

Language

English

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Research Group

QN/Fysics of NanoElectronics

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