Temporal Noise Reduction in CMOS Image Sensors

Doctoral thesis (2021)

Authors

X. Ge Electronic Instrumentation - EEMCS
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2021 X. Ge
DOI: https://doi.org/10.4233/uuid:386c834b-a534-4c0e-8710-1234cfd6bd9e
More Info
expand_more

Published Date

2021

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics.

Files

Dissertation_15092021.pdf
(pdf | 48.6 Mb)
Unknown license