Exploring test opportunities for memory and interconnects in 3D ICs

Conference paper (2012)

Authors

M. Taouil Computer Engineering - EEMCS
M. Lefter Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2012

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering