Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

Zhang, J.; Ishihara, R.; Takagishi, H; Kawajiri, R; Shimoda, T; Beenakker, C.I.M.

Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

Conference paper (2012)

Authors

J. Zhang Electronic Components, Technology and Materials -

R. Ishihara Electronic Components, Technology and Materials -

H Takagishi External organisation

R Kawajiri External organisation

T Shimoda External organisation

C.I.M. Beenakker Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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Published Date

2012

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials